首页 > 分析仪器设备 > 测厚仪 >
3D纳米形貌测量仪
3D纳米形貌测量仪

参考价格

面议

型号

品牌

产地

瑞典

样本

暂无
广州市固润光电科技有限公司

高级会员

|

第1年

|

生产商

工商已核实

留言询价
核心参数
产品介绍
创新点
相关方案
相关资料
用户评论
公司动态
问商家
留言询价
×

*留言类型

*留言内容

*联系人

*单位名称

*电子邮箱

*手机号

提交
点击提交代表您同意 《用户服务协议》《隐私协议》

虚拟号将在 180 秒后失效

使用微信扫码拨号

为了保证隐私安全,平台已启用虚拟电话,请放心拨打(暂不支持短信)
×
是否已沟通完成
您还可以选择留下联系电话,等待商家与您联系

需求描述

单位名称

联系人

联系电话

Email

已与商家取得联系
同意发送给商家
产品介绍
创新点
相关方案
相关资料
用户评论
公司动态
问商家

heliInspectTM H4 - 3D Measurement Head

Equipped with the high-speed 3D imager heliSenseTM S3, this brand new measurement module combines sub-micrometer surface metrology with large field of views. The H4 operates as a non-contact white light interferometer on almost any surface, including glass and metal.

The H4 is engineered for in-line applications requiring high throughput and robustness. Customized modules are available for equipment manufacturers.

As all Heliotis products, the module is manufactured in Switzerland for long lasting reliability.

The instrument utilizes Heliotis’ proven parallel Optical Coherence Tomography principle and offers unmatched scan rates. Fast acquisition rates and a special design of the interferometer render vibration isolation obsolete.

The new 3D vision module can be mounted on most motorized positioning systems. Pre-qualified stages are also available from Heliotis and partners. Choices include

  • resolution 1um (standard), 100 nm (optional)

  • travel range from 40 mm to 1 m

  • software interfaces: C++, LabViewTM, Python

If desired, our engineering team will design and deliver a turn-key system that matches your application.

Specifications

Measurement Module

3D sensor

proprietary smart pixel sensor heliSenseTMS3 with in-pixel signal processing of up to 1 million 2D-slices per second

2D modelive-view for navigation on sample (optional)
light source

standard: high power LED (red)

option: Superluminescent Light Emitting Diode

center= 840 nm, Δλ = 40 nm, Poptical = 8 mW)

field of view

11.28 x 11.6 mm (standard configuration),

numerical aperture0.1 (standard configuration)
working distance16 mm (standard configuration)
vertical resolution200 nm, 20 nm (optional)
vertical scan speedup to 50 mm per second
lateral resolution

40 μm

reflectivity of sample< 0.1 % to 100 %

Scan Module

Z-axis

80 mm vertical scan range

100 nm resolution

up to 100 mm per second

Software

HeliCommander

configuration and control of the system

navigation via 2D live view

graphical representation of 3D topography and profiles

data processing and analysis

data management and storage

automation of measurement tasks (recipes)

Application Programming

Interface

C++, Python and LabView 2012, macros (ImageJ)

(scanner control, 3D-camera configuration and readout, data processing algorithms

Applications

Providing fast and robust 3D-metrological data, Heliotis' unique technology is capable of bringing innovations to many different fields - limited only by your imagination.

To explore what our technology can do for you, please send us a short description of your measurement task. We will gladly perform test measurements of your samples free of charge.

Electronics, Technical Surfaces

CSPs and micro-BGAs continue to increase the packaging density of PCBs, but the ever shrinking pad sizes make it harder to ensure the reliability of the solder joints. Advanced 3D-profiling provides reliable data on solder height and solder volume to fine-tune the screen printer configuration, monitor process statistics for SPC and increase First Pass Yield.

Likewise, the requirement on technical surfaces typically increases with miniaturization as surfaces roughness become more significant and tolerances smaller. True 3D-inspection yields unambiguous quality data and can provide feedback to the manufacturing process.

Micro-mechanics, Micro-optics

Miniaturization allows for innovative products with superior performance at reduced costs. Devices such as MEMS and micro-optics make use of production techniques originally developed for integrated circuits. With dimensions down to the micro-meter range, conventional inspection systems are no longer appropriate - especially where three dimensional accuracy needs to be verified.

The M3 helps the developer to quickly gain an in-depth understanding of the true 3D shapes produced by a set of process parameters. The M3 takes 3D profiles of almost any material (reflective and diffusive). For inspection no preparation of the devices is necessary.

Life Science

The M3 delivers quantitative topological and tomographic data of biological samples in high resolution. Its non-invasive and non-contact measurement principle p-OCT works with non-ionizing visible or near infrared light.

In contrast to scanning electron microscopes, the samples do not need to be coated or evacuated. Thus, the M3 allows for rapid characterization of biological samples and even delivers quantitative 3D data.

Forensics & Security Solutions

Fnology is used for comparing cartridge cases from crime scenes, demonstrating superior performance over legacy 2D systems. Furthermore, the detailed 3D-metrology is instrumental in detecting counterfeits and forgery.

There are numerous possibilities for innovative security products based on micro 3D-features. The M3 is the perfect tool for creating it.

创新点

暂无数据!

相关方案
暂无相关方案。
相关资料
暂无数据。
用户评论

产品质量

10分

售后服务

10分

易用性

10分

性价比

10分
评论内容
暂无评论!
公司动态
暂无数据!
技术文章
暂无数据!
问商家
  • 3D纳米形貌测量仪的工作原理介绍?
  • 3D纳米形貌测量仪的使用方法?
  • 3D纳米形貌测量仪多少钱一台?
  • 3D纳米形貌测量仪使用的注意事项
  • 3D纳米形貌测量仪的说明书有吗?
  • 3D纳米形貌测量仪的操作规程有吗?
  • 3D纳米形貌测量仪的报价含票含运费吗?
  • 3D纳米形貌测量仪有现货吗?
  • 3D纳米形貌测量仪包安装吗?
3D纳米形貌测量仪信息由广州市固润光电科技有限公司为您提供,如您想了解更多关于3D纳米形貌测量仪报价、型号、参数等信息,欢迎来电或留言咨询。
  • 推荐分类
  • 同类产品
  • 该厂商产品
  • 相关厂商
  • 推荐品牌
推荐品牌
同品牌产品
光学延迟线ODL
关注度 475
超短脉冲测量仪FORG
关注度 324
光学平台
关注度 406
免费
咨询
手机站
二维码